| Part Number | SN74BCT8373ANT |
|---|---|
| Part Status | Obsolete |
| Logic Type | Scan Test Device with D-Type Latches |
| Supply Voltage | 4.5 V ~ 5.5 V |
| Number of Bits | 8 |
| Operating Temperature | 0°C ~ 70°C |
| Mounting Type | Through Hole |
| Package / Case | 24-DIP (0.300", 7.62mm) |
| Supplier Device Package | 24-PDIP |
| Weight | - |
| Country of Origin | - |
| Image | Part Number | Manufacturers | Description | View |
|---|---|---|---|---|
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SN74BCT125AD | Texas Instruments | IC BUS BUFF TRI-ST QD 14SOIC | Details |
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SN74BCT125ADG4 | Texas Instruments | IC BUS BUFF TRI-ST QD 14SOIC | Details |
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SN74BCT125ADR | Texas Instruments | IC BUS BUFF 3-ST QUAD 14SOIC | Details |
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SN74BCT125AN | Texas Instruments | IC BUS BUFF TRI-ST QD 14DIP | Details |
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SN74BCT125ANSR | Texas Instruments | IC BUS BUFF 3-ST QUAD 14SO | Details |
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SN74BCT126AD | Texas Instruments | IC BUS BUFF TRI-ST QD 14SOIC | Details |
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SN74BCT126ADE4 | Texas Instruments | IC BUS BUFF TRI-ST QD 14SOIC | Details |
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SN74BCT126ADG4 | Texas Instruments | IC BUS BUFF TRI-ST QD 14SOIC | Details |
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SN74BCT126ADR | Texas Instruments | IC BUS BUFF TRI-ST QD 14SOIC | Details |
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SN74BCT126ADRE4 | Texas Instruments | IC BUS BUFF TRI-ST QD 14SOIC | Details |
